Published December 2011 | Version v1
Journal article

Development of readout interconnections for the Si-W calorimeter of SiD

  • 1. University of California, Davis, One Shields Ave, Davis CA 95616 (United States)
  • 2. University of Oregon, Eugene, OR 97403 (United States)
  • 3. SLAC National Accelerator Laboratory, Menlo Park, CA 94025 (United States)
  • 4. University of California, Santa Cruz 1156 High Street, Santa Cruz, CA 95064 (United States)

Description

The SiD collaboration is developing a Si-W sampling electromagnetic calorimeter, with anticipated application for the International Linear Collider. Assembling the modules for such a detector will involve special bonding technologies for the interconnections, especially for attaching a silicon detector wafer to a flex cable readout bus. We review the interconnect technologies involved, including oxidation removal processes, pad surface preparation, solder ball selection and placement, and bond quality assurance. Our results show that solder ball bonding is a promising technique for the Si-W ECAL, and unresolved issues are being addressed.

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/6/12/C12050

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
6
Journal Issue
12
Journal Page Range
p. C12050
ISSN
1748-0221

Conference

Title
Topical workshop on electronics for particle physics 2011
Acronym
TWEPP-11
Dates
26-30 Sep 2011
Place
Vienna (Austria)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44052733
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BONDING; CALORIMETERS; LINEAR COLLIDERS; OXIDATION; QUALITY ASSURANCE; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; TUNGSTEN
Descriptors DEC
ACCELERATORS; CHEMICAL REACTIONS; ELEMENTS; FABRICATION; JOINING; LINEAR ACCELERATORS; MEASURING INSTRUMENTS; METALS; RADIATION DETECTORS; REFRACTORY METALS; SEMICONDUCTOR DETECTORS; TRANSITION ELEMENTS