Published December 1972 | Version v1
Journal article Metadata-only

Evaluating semiconductor radiation detectors

Creators

Description

no abstract available

Additional details

Publishing Information

Journal Title
Process Instrum.
Journal Volume
1
Journal Issue
9
Series
Process Instrum.
Journal Page Range
431-432

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
4059337
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CRYSTAL DEFECTS; CRYSTALS; ELECTRON DRIFT; ELECTRON MOBILITY; ELECTRONS; FABRICATION; FANO FACTOR; GAMMA SPECTRA; HOLES; IMPURITIES; ION DRIFT; LI-DRIFTED GE DETECTORS; LIFETIME; MATHEMATICAL MODELS; NOMOGRAMS; OXYGEN; P-TYPE CONDUCTORS; QUALITY CONTROL; TESTING
Descriptors DEC
CONTROL; CRYSTAL STRUCTURE; DIAGRAMS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; GE SEMICONDUCTOR DETECTORS; LEPTONS; MEASURING INSTRUMENTS; MOBILITY; NONMETALS; PARTICLE MOBILITY; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; SPECTRA