A three-detector measuring system using a pure-Ge detector
- 1. Iwate Medical Univ., Cyclotron Research Center, Takizawa, Iwate (Japan)
- 2. AIST, Inst. for Geo-Resource and Environment, Tsukuba, Ibaraki (Japan)
- 3. Japan Radioisotope Association, Nishina Memorial Cyclotron Center, Takizawa, Iwate (Japan)
Description
A three-detector measuring system making use of a pure-Ge detector combined with two Si(Li) detectors has been developed. The efficiency curve of the pure-Ge detector has been determined easily as relative efficiencies to those of the existing Si(Li) detectors, since this system allows us to analyze a sample with the pure-Ge and the Si(Li) detectors simultaneously under the same irradiating conditions. It is found that detection efficiencies of the pure-Ge detector decrease just above the absorption edge of Ge owing to absorption of X-rays in the dead layer of the detector. Accuracy of the efficiency curve thus obtained was confirmed by analyzing a few samples whose elemental concentrations are known. It is confirmed that a pure-Ge detector can be used in place of a Si(Li) detector for the purpose of analysis of elements Z ≥ 19, since its energy resolution is almost equal to that of a high-performance Si(Li) detector and efficiencies at high energies are far better. Moreover, it becomes possible to detect prompt γ-rays and to analyze light elements such as fluorine, which arouses much interest from the point of view of environmental contamination. Detection limit of fluorine is found to be less than 0.1 ppm for water samples. (author)
Additional details
Publishing Information
- Journal Title
- International Journal of PIXE
- Journal Volume
- 13
- Journal Issue
- 1-2
- Journal Page Range
- p. 23-35
- ISSN
- 0129-0835
Conference
- Title
- 19. symposium on PIXE in Japan
- Dates
- 9-11 Oct 2002
- Place
- Akita (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 36064081
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EFFICIENCY; ENERGY RESOLUTION; FLUORINE; GAMMA DETECTION; GE SEMICONDUCTOR DETECTORS; GERMANIUM; LI-DRIFTED SI DETECTORS; MEASURING METHODS; PIXE ANALYSIS; PROMPT GAMMA RADIATION; QUANTITATIVE CHEMICAL ANALYSIS; X-RAY DETECTION
- Descriptors DEC
- CHEMICAL ANALYSIS; DETECTION; ELECTROMAGNETIC RADIATION; ELEMENTS; GAMMA RADIATION; HALOGENS; IONIZING RADIATIONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 10 refs., 8 figs.