Published August 2009 | Version v1
Journal article

Relative grain boundary area and energy distributions in nickel

  • 1. Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 (United States)

Description

The three-dimensional interfacial network of grain boundaries in polycrystalline nickel has been characterized using a combination of electron backscatter diffraction mapping and focused ion beam serial sectioning. These data have been used to determine the relative areas of different grain boundary types, categorized on the basis of lattice misorientation and grain boundary plane orientation. Using the geometries of the interfaces at triple lines, relative grain boundary energies have also been determined as a function of lattice misorientation and grain boundary plane orientation. Grain boundaries comprising (1 1 1) planes have, on average, lower energies than other boundaries. Asymmetric tilt grain boundaries with the Σ9 misorientation also have relatively low energies. The grain boundary energies and areas are inversely correlated.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.actamat.2009.06.004

Additional details

Identifiers

DOI
10.1016/j.actamat.2009.06.004;
PII
S1359-6454(09)00342-5;

Publishing Information

Journal Title
Acta Materialia
Journal Volume
57
Journal Issue
14
Journal Page Range
p. 4304-4311
ISSN
1359-6454
CODEN
ACMAFD

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43038928
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ASYMMETRY; BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRONS; ENERGY SPECTRA; GRAIN BOUNDARIES; GRAIN ORIENTATION; INTERFACES; ION BEAMS; NICKEL; POLYCRYSTALS
Descriptors DEC
BEAMS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; METALS; MICROSTRUCTURE; ORIENTATION; SCATTERING; SPECTRA; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.