Relative grain boundary area and energy distributions in nickel
Creators
- 1. Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213 (United States)
Description
The three-dimensional interfacial network of grain boundaries in polycrystalline nickel has been characterized using a combination of electron backscatter diffraction mapping and focused ion beam serial sectioning. These data have been used to determine the relative areas of different grain boundary types, categorized on the basis of lattice misorientation and grain boundary plane orientation. Using the geometries of the interfaces at triple lines, relative grain boundary energies have also been determined as a function of lattice misorientation and grain boundary plane orientation. Grain boundaries comprising (1 1 1) planes have, on average, lower energies than other boundaries. Asymmetric tilt grain boundaries with the Σ9 misorientation also have relatively low energies. The grain boundary energies and areas are inversely correlated.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2009.06.004Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2009.06.004;
- PII
- S1359-6454(09)00342-5;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 57
- Journal Issue
- 14
- Journal Page Range
- p. 4304-4311
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43038928
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ASYMMETRY; BACKSCATTERING; ELECTRON DIFFRACTION; ELECTRONS; ENERGY SPECTRA; GRAIN BOUNDARIES; GRAIN ORIENTATION; INTERFACES; ION BEAMS; NICKEL; POLYCRYSTALS
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; METALS; MICROSTRUCTURE; ORIENTATION; SCATTERING; SPECTRA; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.