Characterization Of Lead Glass For Capture X-Ray Images
Creators
- 1. Pusat Rekayasa Perangkat Nuklir, Kawasan PUSPIPTEK Serpong, Gedung 71, Tangerang Selatan, 153100 (Indonesia)
Description
Characterization has been made of lead glass for X-ray image capture. ThLs characterization aims to determine the quality of the lead glass to X-ray absorption and light transmission. X-ray machine will be operated at the operating voltage of 60 keV. Theoretical calculations of X-ray absorption is based on the assumption that the dominant composition of lead glass is Si02, PbO, then specify the density (p) and the linear absorption coefficient (µ). While the light transmission is calculated using Light Dependent Resistor (LOR). The results show that the characterization of lead glass with a thickness of 1.7 em is capable of absorbing radiation X-ray light and still be able to continue in accordance with the provisions of SNI 16-656-2002 about lead glass for X-ray protection. The conclusion of this characterization is to meet the standards of lead glass for use in X-ray image capture. (author)
Files
54089397.pdf
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Additional details
Additional titles
- Original title (Indonesian)
- Karakterisasi Kaca Timbal Untuk Penangkap Citra Sinar-X
Publishing Information
- Publisher
- Center for Nuclear Device Engineering
- Imprint Place
- Serpong (Indonesia)
- Imprint Title
- Proceedings of the Scientific Engineering Meeting for Nuclear Devices
- Imprint Pagination
- 378 p.
- Journal Page Range
- p. 55-62
- ISSN
- 1693-3346
- Report number
- INIS-ID--109
Conference
- Title
- Scientific Engineering Meeting for Nuclear Devices
- Original Conference Title
- Pertemuan Ilmiah Rekayasa Perangkat Nuklir
- Dates
- 30 Nov 2011
- Place
- Serpong (Indonesia)
INIS
- Country of Publication
- Indonesia
- Country of Input or Organization
- Indonesia
- INIS RN
- 54089397
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; CALCULATION METHODS; CAPTURE; GLASS; IMAGE PROCESSING; LEAD; LIGHT TRANSMISSION; RESISTORS; THICKNESS; X-RAY DETECTION
- Descriptors DEC
- DETECTION; DIMENSIONS; ELECTRICAL EQUIPMENT; ELEMENTS; EQUIPMENT; METALS; PROCESSING; RADIATION DETECTION; SORPTION; TRANSMISSION
Optional Information
- Notes
- 6 refs.; 7 tabs.; 1 fig. Imprint:Prosiding Pertemuan Ilmiah Rekayasa Perangkat Nuklir