Published November 1, 1991 | Version v1
Journal article

Above-surface neutralization of highly charged ions: The classical over-the-barrier model

  • 1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6377 (United States)
  • 2. Department of Physics, University of Tennessee, Knoxville, Tennessee 37996-1200 (United States)
  • 3. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6372 (United States)

Description

The neutralization of highly charged ions during interaction with metallic surfaces is accompanied by the ejection of a large number of secondary electrons. Recent experiments demonstrate two main contributions to this electron ejection process: one from the region below the surface and the second from the above-surface portion of the trajectory. We present a theoretical analysis of the neutralization dynamics above the surface, prior to impact, based on the classical over-the-barrier model. The theory incorporates resonant multielectron capture of conduction electrons, resonant loss into unoccupied states of the conduction band, and intra-atomic Auger deexcitation. The effective barrier potential includes quantum corrections to the classical image potential. The effect of below-barrier (''tunneling'') transfer is investigated. The solution of a coupled system of rate equations allows the approximate determination of the n-shell populations, the projectile charge state, and the total number of Auger electrons. The calculation describes the transient formation of ''hollow'' atoms. We find satisfactory agreement with recent data for K Auger yields by Meyer et al. [Phys. Rev. Lett. 67, 723 (1991)]

Additional details

Publishing Information

Journal Title
Physical Review, A
Journal Volume
44
Journal Issue
9
Series
Phys. Rev., A.
Journal Page Range
5674-5685
ISSN
0556-2791
CODEN
PLRAA

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23020815
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
AUGER EFFECT; BEAM NEUTRALIZATION; ION COLLISIONS; KINETICS; MULTICHARGED IONS; SECONDARY EMISSION; SURFACE POTENTIAL; SURFACES
Descriptors DEC
CHARGED PARTICLES; COLLISIONS; EMISSION; IONS; POTENTIALS