Above-surface neutralization of highly charged ions: The classical over-the-barrier model
Creators
- 1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6377 (United States)
- 2. Department of Physics, University of Tennessee, Knoxville, Tennessee 37996-1200 (United States)
- 3. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6372 (United States)
Description
The neutralization of highly charged ions during interaction with metallic surfaces is accompanied by the ejection of a large number of secondary electrons. Recent experiments demonstrate two main contributions to this electron ejection process: one from the region below the surface and the second from the above-surface portion of the trajectory. We present a theoretical analysis of the neutralization dynamics above the surface, prior to impact, based on the classical over-the-barrier model. The theory incorporates resonant multielectron capture of conduction electrons, resonant loss into unoccupied states of the conduction band, and intra-atomic Auger deexcitation. The effective barrier potential includes quantum corrections to the classical image potential. The effect of below-barrier (''tunneling'') transfer is investigated. The solution of a coupled system of rate equations allows the approximate determination of the n-shell populations, the projectile charge state, and the total number of Auger electrons. The calculation describes the transient formation of ''hollow'' atoms. We find satisfactory agreement with recent data for K Auger yields by Meyer et al. [Phys. Rev. Lett. 67, 723 (1991)]
Additional details
Publishing Information
- Journal Title
- Physical Review, A
- Journal Volume
- 44
- Journal Issue
- 9
- Series
- Phys. Rev., A.
- Journal Page Range
- 5674-5685
- ISSN
- 0556-2791
- CODEN
- PLRAA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23020815
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER EFFECT; BEAM NEUTRALIZATION; ION COLLISIONS; KINETICS; MULTICHARGED IONS; SECONDARY EMISSION; SURFACE POTENTIAL; SURFACES
- Descriptors DEC
- CHARGED PARTICLES; COLLISIONS; EMISSION; IONS; POTENTIALS