Published 2002 | Version v1
Computer medium Metadata-only

Si diodes utilization for alpha spectrometry

Creators

  • 1. Instituto de Pesquisas Energeticas e Nucleares (IPEN), Sao Paulo, SP (Brazil)
  • 2. Pontificia Univ. Catolica de Sao Paulo, SP (Brazil). Dept. de Fisica

Description

In this paper we describe studies concerning the origin of the ghost peaks in charged-particle spectra using silicon photodiodes SFH00206 (Siemens) and S3590-06 (Hamamatsu). The results obtained in alpha spectrometry show good energy resolution for both diodes and indicate they are suitable for this kind of measurement. On the other hand, ghost peaks were only found with the Hamamatsu diode, probably due to the presence of guard rings in its structure. (author)

Part of:
Proceedings of the INAC 2002: International nuclear atlantic conference; 13. Brazilian national meeting on reactor physics and thermal hydraulics; 6. Brazilian national meeting on nuclear applications

Additional details

Additional titles

Original title (Portuguese)
Utilizacao de diodos de Si para espectrometria alfa

Publishing Information

Imprint Title
Proceedings of the INAC 2002: International nuclear atlantic conference; 13. Brazilian national meeting on reactor physics and thermal hydraulics; 6. Brazilian national meeting on nuclear applications
Imprint Pagination
[3080 p.]
Journal Page Range
[5 p.]

Conference

Title
International nuclear atlantic conference; 13. Brazilian national meeting on reactor physics and thermal hydraulics; 6. Brazilian national meeting on nuclear applications
Acronym
INAC 2002
Dates
11-16 Aug 2002
Place
Rio de Janeiro, RJ (Brazil)

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
33053130
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ALPHA SPECTROSCOPY; ENERGY RESOLUTION; EXPERIMENTAL DATA; PHOTODIODES; SEMICONDUCTOR DETECTORS; SILICON
Descriptors DEC
DATA; ELEMENTS; INFORMATION; MEASURING INSTRUMENTS; NUMERICAL DATA; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS; SPECTROSCOPY

Optional Information

Notes
15 refs., 3 figs., 1 tab., 5 graphs Imprint:Published only in CD-Rom