A Diffractometer Control System with Automatic UB-matrix Refinement
Creators
- 1. SPring-8/JASRI, Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto Mikazuki-cho Sayo-gun Hyogo 679-5198 (Japan)
- 2. SPring-8/JAERI, Japan Atomic Energy Research Institute, 1-1-1 Kouto Mikazuki-cho Sayo-gun Hyogo 679-5148 (Japan)
Description
A four-axes diffractometer control system with automatic UB-matrix refinement has been developed. The system automatically scans and finds peak positions after specifying a set of indexes, then the system calculates the UB-martix. Combining with continuous scan, the control system reduces a UB-matrix determination time. The system was developed based on a message exchanging control framework. Users can control not only a diffractometer but also other components like a monochromator and an insertion device using man-readable abstract messages. Therefore users easily develop programs for their experiments. Results of test measurements at the beamline BL46XU of the SPring-8 indicate that the automatic UB-matrix refinement is working well, and it reduces the refinement time of the UB-matrix about one fourth
Additional details
Identifiers
- DOI
- 10.1063/1.1758022;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 705
- Journal Issue
- 1
- Journal Page Range
- p. 1229-1232
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 8. international conference on synchrotron radiation instrumentation
- Dates
- 25-29 Aug 2003
- Place
- San Francisco, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36092433
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUTOMATION; COMPUTERIZED CONTROL SYSTEMS; CONTROL; COPPER; DIAMONDS; EQUIPMENT; LATTICE PARAMETERS; SPRING-8 STORAGE RING; SYNCHROTRON RADIATION; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- BREMSSTRAHLUNG; CARBON; COHERENT SCATTERING; CONTROL SYSTEMS; DIFFRACTION; DIFFRACTOMETERS; ELECTROMAGNETIC RADIATION; ELEMENTS; MEASURING INSTRUMENTS; METALS; MINERALS; NONMETALS; ON-LINE CONTROL SYSTEMS; ON-LINE SYSTEMS; RADIATION SOURCES; RADIATIONS; SCATTERING; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2004 American Institute of Physics