Published March 15, 1994
| Version v1
Journal article
Measurements of a radiation hardened process: Harris AVLSIRA
Creators
- 1. Rutherford Appleton Lab., Chilton (United Kingdom)
- 2. Blackett Lab., Imperial Coll., London (United Kingdom)
- 3. Dept. of Informatics, Univ. of Oslo (Norway)
- 4. CERN, Geneve (Switzerland)
Description
The Harris AVLSIRA process is a bulk CMOS process that has been specifically developed for use in radiation environments. It is being studied in order to assess its suitability for use in the readout electronics that are being developed for proposed future large hadronic colliders. Initial studies from one processing batch are presented. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 342
- Journal Issue
- 1
- Journal Page Range
- p. 164-168.
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 1. international symposium on development and application of semiconductor tracking detectors (Hiroshima STD Symposium).
- Dates
- 22-24 May 1993.
- Place
- Hiroshima (Japan).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 25056215
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; BACKGROUND NOISE; CAPACITORS; INTEGRATED CIRCUITS; MOSFET; PREAMPLIFIERS; PULSE AMPLIFIERS; RADIATION HARDENING; READOUT SYSTEMS; RESPONSE FUNCTIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; TRANSIENTS; TRANSISTOR AMPLIFIERS
- Descriptors DEC
- AMPLIFIERS; ELECTRICAL EQUIPMENT; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; ENERGY STORAGE SYSTEMS; EQUIPMENT; FIELD EFFECT TRANSISTORS; FUNCTIONS; HARDENING; HEAT TREATMENTS; MOS TRANSISTORS; NOISE; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; TRANSISTORS