Published 1978 | Version v1
Journal article

Activation analysis of elements with Z=22-31 on charged particles with registration of roentgen radiation

  • 1. AN Uzbekskoj SSR, Tashkent. Inst. Yadernoj Fiziki

Description

Possibilities of activation analysis using charged particles with registration of induced characteristic radiation have been studied. The work tasks are: 1) investigation of characteristic X-radiation yields from thick targets of medium elements with Z=23-31 as to nuclear reactions, proceeding under the effect of protons and deutrons with the energies up to 16 and 18 MeV respectively; 2) investigation of different processes effect on the analysis results: absorption of characteristic X-radiation in a sample, the change of charged particle energy at their penetration into the sample, appearance of secondary fluorescence X-radiation etc. The sample irradiation has been carried out using a 150 sm cyclotron. The method of foil pile has been used in measurements. The registration of characteristic X-radiation has been carried out proportionally by a counter and semiconductor Ge(Li)-detector. Characteristic X-radiation yield for the reactions considered constitutes 105-108 quantum/s/μA-r. It is proved that the linearity of the dependence of the activity measured on the concentration even in most unfavourable cases remains at admixture element concentration of 0.1%, that is the analysis can be conducted only at lower contents. Conclusion is made that the method permits to determine the content of the above elements with sensitivity of 10-4-10-7 (H/H)μA-r (decay/s)

Additional details

Additional titles

Original title (Russian)
Активационный анализ элементов с З=22-31 на заряженных частицах с регистрацией рентгеновского излучения

Publishing Information

Journal Title
Izv. Akad. Nauk Uzb. SSR, Ser. Fiz.-Mat. Nauk
Journal Issue
no.2
Series
Izv. Akad. Nauk Uzb. SSR, Ser. Fiz.-Mat. Nauk.

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
10490300
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ACTIVATION ANALYSIS; CHARGED PARTICLES; QUANTITY RATIO; SENSITIVITY; X RADIATION
Descriptors DEC
CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS