Published November 2005 | Version v1
Journal article

Mounting of Escherichia coli spheroplasts for AFM imaging

  • 1. Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6123 (United States)
  • 2. Genome Science and Technology, University of Tennessee, Knoxville, TN 37932 (United States)
  • 3. Molecular Imaging Inc., Tempe, AZ 85282 (United States)
  • 4. Life Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6123 (United States)
  • 5. Department of Biochemistry and Cellular and Molecular Biology, University of Tennessee, Knoxville, TN 37932 (United States)
  • 6. Genome Science and Technology, University of Tennessee, Knoxville, TN 37932 (United States) and Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6123 (United States) and Life Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6123 (United States)

Description

The cytoplasmic membrane of Escherichia coli (E. coli) is the location of numerous, chemically specific transporters and recognition elements. Investigation of this membrane in vivo by atomic force microscopy (AFM) requires removal of the cell wall and stable immobilization of the spheroplast. AFM images demonstrate that spheroplasts can be secured with warm gelatin applied to the mica substrate just before the addition of a spheroplast suspension. The resulting preparation can be repeatedly imaged by AFM over the course of several hours. Confocal fluorescence imaging confirms the association of the spheroplasts with the gelatin layer. Gelatin molecules are known to reorder into a network after heating. Entrapment within this gelatin network is believed to be responsible for the immobilization of spheroplasts on mica

Additional details

Identifiers

DOI
10.1016/j.ultramic.2005.06.023;
PII
S0304-3991(05)00126-9;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
105
Journal Issue
1-4
Journal Page Range
p. 96-102
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
6. international conference on scanning probe microscopy, sensors and nanostructures
Acronym
SPM 2004
Dates
24-26 May 2004
Place
Beijing (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37043117
Subject category
S60: APPLIED LIFE SCIENCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CELL WALL; ESCHERICHIA COLI; FLUORESCENCE; GELATIN; IN VIVO; MEMBRANES; MICA; SUSPENSIONS
Descriptors DEC
BACTERIA; CELL CONSTITUENTS; COLLOIDS; DISPERSIONS; EMISSION; LUMINESCENCE; MICROORGANISMS; MICROSCOPY; MINERALS; ORGANIC COMPOUNDS; PHOTON EMISSION; PROTEINS; SILICATE MINERALS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.