Published April 1, 1988
| Version v1
Journal article
Area detectors for X-ray spectroscopy
- 1. Tennessee Univ., Knoxville (USA)
- 2. National Bureau of Standards, Gaithersburg, MD (USA)
- 3. Oak Ridge National Lab., TN (USA)
Description
Area detectors greatly increase the efficiency of data acquisition in spectroscopic applications. The operating principles, advantages and limitations of two types of detectors system are described. They are the microchannel plate (MCP) with resistive anode readout, and the silicon charged-coupled-device (CCD), both with and without MCP enhancement. The linearity, size, resolution, quantum efficiency, noise specifications, stability, and uniformity of response are discussed. Data acquisition electronics are described briefly. The use of the devices is illustrated with applications to electron and soft X-ray spectroscopy. (orig.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods Phys. Res., Sect. A
- Journal Volume
- 266
- Journal Issue
- 1-3
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 578-585
- ISSN
- 0168-9002
- CODEN
- NIMAE
Conference
- Title
- 5. national conference on synchrotron radiation instrumentation (SRI-5).
- Dates
- 21-25 Jun 1987.
- Place
- Madison, WI (USA).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19073344
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND NOISE; CALIBRATION; CHARGE-COUPLED DEVICES; DATA ACQUISITION; DATA ACQUISITION SYSTEMS; EFFICIENCY; ELECTRON MULTIPLIER DETECTORS; MICROCHANNEL ELECTRON MULTIPLI; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; RESPONSE FUNCTIONS; SENSITIVITY; SI SEMICONDUCTOR DETECTORS; SPATIAL RESOLUTION; STABILITY; X-RAY DETECTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; ELECTRON MULTIPLIERS; ELECTRON TUBES; FUNCTIONS; MEASURING INSTRUMENTS; NOISE; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SPECTROSCOPY
Optional Information
- Contract/Grant/Project number
- Contract DE-AC05-84OR21400; Grant DMR-81-14888; DMR-85-03541