Structure and hydrogen generation mechanism of Si-based agent
- 1. Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka, 567-0047 (Japan)
Description
Highlights: • Si-based agent generates a high amount of hydrogen in bowels condition. • For hydrogen generation from Si-based agent, OH− ions are the reacting species. • The Si 2p peak for SiO2 greatly increases with the hydrogen generation reaction time. • The increase in the shift of the Si 2p peak for SiO2 is attributable to charging. • Si-based agent has 2> structure. Si-based agent fabricated from Si powder generates a high amount of hydrogen by reactions with weak alkaline solutions for long periods (e.g., more than 500 mL/g hydrogen at pH8.5 and 36 °C for 24 h). The hydrogen generation rate greatly increases with pH, indicating that the reacting species is OH− ions. In the Si 2p XPS spectra of Si-based agent, peaks due to suboxide species and SiO2 are present. The suboxide layer is present near the Si core, and the SiO2 layer outside of the suboxide layer. The charging effect caused by photoemission largely shifts the Si 2p peak due to SiO2 while the shifts induced by charging are much lower for suboxide species. This phenomenon is well explained by the silicon oxide structure that SiO2 is present outside of the suboxide species.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2020.147398Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2020.147398;
- PII
- S0169433220321553;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 536
- Journal Page Range
- vp.
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54078378
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- HYDROXIDES; INTERSTITIAL HYDROGEN GENERATION; IONS; LAYERS; PEAKS; PH VALUE; SILICA; SILICON OXIDES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; ELECTRON SPECTROSCOPY; HYDROGEN COMPOUNDS; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.