Published 1980
| Version v1
Journal article
Thickness effect in radiation damage: real or artefact
Description
Damage caused by an electron beam in a crystalline organic substance, as observed by the decay of its diffraction pattern, apparently decreased with increasing specimen thickness. The dose needed to destroy the pattern increased with thickness at given voltage. Such a thickness dependence of 'lethal' dose is difficult to explain on any simple theory of radiation damage. It is suggested that the effect is in part a consequence of the experimental method. If so, the same limitation would apply to any criterion of damage rate in which measurement of the end-point relies upon a certain minimum electron signal. (author)
Additional details
Publishing Information
- Journal Title
- Micron
- Journal Volume
- 11
- Journal Issue
- 2
- Series
- Micron.
- Journal Page Range
- 183-187
- ISSN
- 0047-7206
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 11569166
- Subject category
- S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY;
- Descriptors DEI
- CARBOXYLIC ACID SALTS; CHEMICAL RADIATION EFFECTS; CRYSTALS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRONS; FILMS; LEAD COMPOUNDS; OCTADECANOIC ACID; RADIATION DOSES; THICKNESS
- Descriptors DEC
- BEAMS; CARBOXYLIC ACIDS; COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELEMENTARY PARTICLES; FERMIONS; LEPTON BEAMS; LEPTONS; MONOCARBOXYLIC ACIDS; ORGANIC ACIDS; ORGANIC COMPOUNDS; PARTICLE BEAMS; RADIATION EFFECTS; SCATTERING