Published December 2012 | Version v1
Journal article Metadata-only

Correlation of dynamic parameter modification and ASET sensitivity in a shunt voltage reference

Creators

  • 1. George Washington University, Washington, DC 20052 (United States)
  • 2. U.S. Naval Research Laboratory, Washington, DC 20375 (United States)
  • 3. Universite Montpellier 2, IES-UMR CNRS 5214, F-34095, Montpellier cedex 5, (France)
  • 4. Naval Research Laboratory, Washington DC 20375 (United States)
  • 5. Texas Instruments, Santa Clara, CA 95052-8090 (United States)
  • 6. CEA/GRAMAT, DAM, Commissariat a l'Energie Atomique et aux Energies Alternatives, F-46500, Gramat, (France)
  • 7. DGA, Direction Generale de l'Armement, F-92221, Bagneux cedex, (France)

Description

Analog Single Event Transients (ASETs) in two different shunt voltage references used in power management systems are investigated. Little has been published regarding how the dynamic parameter changes induced by external circuit design, such as time constant, damping coefficient or natural frequency affect ASET shapes. Modifications of the dynamic parameters of the circuit are measured by step response measurement. A correlation between dynamic parameters and ASET laser testing results is proposed. This study establishes the correlation between the dynamic parameters of a shunt voltage reference and ASET parameters such as pulse duration, and positive and negative amplitude. (authors)

Availability note (English)

Available from doi: http://dx.doi.org/10.1109/TNS.2012.2224127

Additional details

Identifiers

DOI
10.1109/TNS.2012.2224127;

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
59
Journal Issue
no.6
Journal Page Range
p. 2756-2763
ISSN
0018-9499

INIS

Country of Publication
United States
Country of Input or Organization
France
INIS RN
46018281
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
DAMPING; ELECTRONIC CIRCUITS; PHYSICAL RADIATION EFFECTS; TRIGGER CIRCUITS
Descriptors DEC
ELECTRONIC CIRCUITS; PULSE CIRCUITS; RADIATION EFFECTS

Optional Information

Notes
21 refs.