Published June 21, 2016 | Version v1
Journal article

A maximum likelihood analysis of the CoGeNT public dataset

Creators

  • 1. Department of Physics, University of North Florida, Jacksonville, FL 32224 (United States)

Description

The CoGeNT detector, located in the Soudan Underground Laboratory in Northern Minnesota, consists of a 475 grams (fiducial mass of 330 grams) target mass of p-type point contact germanium detector that measures the ionization charge created by nuclear recoils. This detector has searched for recoils created by dark matter since December of 2009. We analyze the public dataset from the CoGeNT experiment to search for evidence of dark matter interactions with the detector. We perform an unbinned maximum likelihood fit to the data and compare the significance of different WIMP hypotheses relative to each other and the null hypothesis of no WIMP interactions. This work presents the current status of the analysis.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1743
Journal Issue
1
Journal Page Range
vp.
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
Workshop on dark matter, neutrino physics and astrophysics; PPC 2015: 9. international conference on interconnections between particle physics and cosmology
Acronym
CETUP 2015
Dates
15 Jun - 17 Jul 2015
Place
Deadwood, SD (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48055082
Subject category
S79: ASTROPHYSICS, COSMOLOGY AND ASTRONOMY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPARATIVE EVALUATIONS; DATASETS; GE SEMICONDUCTOR DETECTORS; GERMANIUM; HYPOTHESIS; INTERACTIONS; IONIZATION; MASS; MAXIMUM-LIKELIHOOD FIT; NONLUMINOUS MATTER; UNDERGROUND; WIMPS
Descriptors DEC
DOCUMENT TYPES; ELEMENTARY PARTICLES; ELEMENTS; EVALUATION; LEVELS; MATHEMATICAL SOLUTIONS; MATTER; MEASURING INSTRUMENTS; METALS; NUMERICAL SOLUTION; POSTULATED PARTICLES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Notes
(c) 2016 Author(s)