Published April 1, 2005 | Version v1
Journal article

Design and properties of the GLAST flight silicon micro-strip sensors

  • 1. Department of Physics, Hiroshima University, Higashi-Hiroshima 739-8526 (Japan)
  • 2. Hamamatsu Photonics (HPK), Hamamatsu 435 (Japan)
  • 3. SCIPP, University of California Santa Cruz, CA 95064 (United States)

Description

We have designed and developed the flight model silicon micro-strip detector (FM-SSD) for Large Area Space Telescope (GLAST). The concepts and details of the sensor design are described and the results of production testing of the SSDs are reported. A total of 11,500 FM-SSDs were produced in the 2-year time span from the start of 2001 to the end of 2003. The fabrication was done on the 6-in process line at Hamamatsu Photonics Company. The properties of each SSD were determined by measuring a set of specific parameters. The leakage current and dead channel rate establish a new performance standard for SSD mass production, indicating that the SSD design and fabrication technologies have been well optimized and are well matured

Additional details

Identifiers

DOI
10.1016/j.nima.2005.01.035;
PII
S0168-9002(05)00047-1;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
541
Journal Issue
1-2
Journal Page Range
p. 29-39
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
5. international symposium on development and application of semiconductor tracking detectors
Acronym
STD 5
Dates
14-17 Jun 2004
Place
Hiroshima (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37033541
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DESIGN; FABRICATION; LEAKAGE CURRENT; PERFORMANCE; PERFORMANCE TESTING; SI MICROSTRIP DETECTORS; SILICON; SPACE; STANDARDS; TELESCOPES
Descriptors DEC
CURRENTS; ELECTRIC CURRENTS; ELEMENTS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SI SEMICONDUCTOR DETECTORS; TESTING

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.