Published April 1, 2005
| Version v1
Journal article
Design and properties of the GLAST flight silicon micro-strip sensors
Creators
- 1. Department of Physics, Hiroshima University, Higashi-Hiroshima 739-8526 (Japan)
- 2. Hamamatsu Photonics (HPK), Hamamatsu 435 (Japan)
- 3. SCIPP, University of California Santa Cruz, CA 95064 (United States)
Description
We have designed and developed the flight model silicon micro-strip detector (FM-SSD) for Large Area Space Telescope (GLAST). The concepts and details of the sensor design are described and the results of production testing of the SSDs are reported. A total of 11,500 FM-SSDs were produced in the 2-year time span from the start of 2001 to the end of 2003. The fabrication was done on the 6-in process line at Hamamatsu Photonics Company. The properties of each SSD were determined by measuring a set of specific parameters. The leakage current and dead channel rate establish a new performance standard for SSD mass production, indicating that the SSD design and fabrication technologies have been well optimized and are well matured
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2005.01.035;
- PII
- S0168-9002(05)00047-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 541
- Journal Issue
- 1-2
- Journal Page Range
- p. 29-39
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 5. international symposium on development and application of semiconductor tracking detectors
- Acronym
- STD 5
- Dates
- 14-17 Jun 2004
- Place
- Hiroshima (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37033541
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; FABRICATION; LEAKAGE CURRENT; PERFORMANCE; PERFORMANCE TESTING; SI MICROSTRIP DETECTORS; SILICON; SPACE; STANDARDS; TELESCOPES
- Descriptors DEC
- CURRENTS; ELECTRIC CURRENTS; ELEMENTS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; SI SEMICONDUCTOR DETECTORS; TESTING
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.