Published March 15, 2010
| Version v1
Journal article
The effect of ion sputtering of silicon substrates on the catalyst morphology and growth of carbon nanotube arrays
- 1. Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139-4307 (United States)
- 2. Key Laboratory of Radiation Beam Technology and Materials Modification of Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875 (China)
- 3. Program of Material Science, Masdar Institute of Science and Technology, Masdar, P.O. Box 54115, Abu Dhabi (United Arab Emirates)
Description
Polished Si substrates are sputtered by He+ ions, and carbon nanotube arrays are prepared on the Fe-coated substrates by heat chemical vapor deposition from acetylene. Scanning electron microscopy and atomic force microscopy are employed to examine the morphologies of sputtered substrates, catalyst and carbon nanotube arrays. It is found that ion sputtering is effective in increasing the roughness of Si substrates, and helpful in obtaining higher density Fe catalyst particles and better-aligned carbon nanotube arrays.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2009.12.015Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2009.12.015;
- PII
- S0168-583X(09)01329-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 268
- Journal Issue
- 6
- Journal Page Range
- p. 568-572
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41083293
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACETYLENE; ATOMIC FORCE MICROSCOPY; CARBON; CATALYSTS; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; HELIUM IONS; MORPHOLOGY; NANOTUBES; ROUGHNESS; SCANNING ELECTRON MICROSCOPY; SILICON; SPUTTERING; SUBSTRATES
- Descriptors DEC
- ALKYNES; CHARGED PARTICLES; CHEMICAL COATING; DEPOSITION; ELECTRON MICROSCOPY; ELEMENTS; HYDROCARBONS; IONS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; ORGANIC COMPOUNDS; SEMIMETALS; SURFACE COATING; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.