Iron-assisted ion beam patterning of Si(001) in the crystalline regime
Creators
- 1. II. Physikalisches Institut, Universität zu Köln, Zülpicher Strasse 77, D-50937 Cologne (Germany)
- 2. Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, PO Box 510119, D-01314 Dresden (Germany)
- 3. Leibniz-Institut für Oberflächenmodifizierung eV, Permoserstrasse 15, D-04318 Leipzig (Germany)
Description
We present ion beam erosion experiments on Si(001) with simultaneous sputter co-deposition of steel at 660 K. At this temperature, the sample remains within the crystalline regime during ion exposure and pattern formation takes place by phase separation of Si and iron-silicide. After an ion fluence of F ≈ 5.9 × 1021 ions m-2, investigations by atomic force microscopy and scanning electron microscopy identify sponge, segmented wall and pillar patterns with high aspect ratios and heights of up to 200 nm. Grazing incidence x-ray diffraction and transmission electron microscopy reveal the structures to be composed of polycrystalline iron-silicide. The observed pattern formation is compared to that in the range of 140-440 K under otherwise identical conditions, where a thin amorphous layer forms due to ion bombardment. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1367-2630/14/7/073003Additional details
Identifiers
Publishing Information
- Journal Title
- New Journal of Physics
- Journal Volume
- 14
- Journal Issue
- 7
- Journal Page Range
- [16 p.]
- ISSN
- 1367-2630
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44004920
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ASPECT RATIO; ATOMIC FORCE MICROSCOPY; ION BEAMS; IONS; IRON; IRON SILICIDES; LAYERS; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SILICON; TEMPERATURE RANGE 0400-1000 K; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; DIMENSIONLESS NUMBERS; ELECTRON MICROSCOPY; ELEMENTS; IRON COMPOUNDS; METALS; MICROSCOPY; SCATTERING; SEMIMETALS; SILICIDES; SILICON COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS