Published August 1, 1996
| Version v1
Journal article
New pixel detector concepts based on junction field effect transistors on high resistivity silicon
Creators
- 1. Max-Planck-Institut fuer Physik, Muenchen (Germany). Halbleiterlabor
- 2. KETEK GmbH, Oberschleissheim (Germany)
Description
A p-channel Junction Field Effect Transistor on a fully depleted high ohmic silicon substrate (DEPJFET) has been used as unit cell for pixel detectors. The most important features of this structure are the internal charge amplification, the low power consumption and the low detector capacitance leading to a high signal to noise ratio. Two different prototype designs, featuring pulsed or continuous reset, have been fabricated and tested. Both have been characterized with respect to their signal performance and noise behavior. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 377
- Journal Issue
- 2-3
- Journal Page Range
- p. 521-528.
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 7. European symposium on semiconductor detectors, new developments in radiation detectors.
- Dates
- 7-10 May 1995.
- Place
- Schloss Elmau (Germany).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 27068918
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAPACITANCE; FIELD EFFECT TRANSISTORS; JUNCTION DETECTORS; JUNCTION TRANSISTORS; KEV RANGE 01-10; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SIGNAL-TO-NOISE RATIO; SILICON; SPECTRAL DENSITY; SUBSTRATES; X-RAY DETECTION
- Descriptors DEC
- DETECTION; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY RANGE; FUNCTIONS; KEV RANGE; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMIMETALS; SPECTRAL FUNCTIONS; TRANSISTORS