Published August 2009 | Version v1
Journal article

Influence of the tip mass and position on the AFM cantilever dynamics: Coupling between bending, torsion and flexural modes

  • 1. Department of Mechanical Engineering, Shahid Bahonar University of Kerman, Kerman (Iran, Islamic Republic of)
  • 2. Department of Mechanical Engineering, Isfahan University of Technology (IUT), Isfahan 84156-83111 (Iran, Islamic Republic of)

Description

The effects of the geometrical asymmetric related to tip position as a concentrated mass, on the sensitivity of all three vibration modes, lateral excitation (LE), torsional resonance (TR) and vertical excitation (VE), of an atomic force microscopy (AFM) microcantilever have been analyzed. The effects of the tip mass and its position are studied to report the novel results to estimating the vibration behavior of AFM such as resonance frequency and amplitude of the microcantilever. In this way, to achieve more accurate results, the coupled motion in all three modes is considered. In particular, it is investigated that performing the coupled motion in analysis of AFM microcantilever is almost necessary. It is shown that the tip mass and its position have significant effects on vibrational responses. The results show that considering the tip mass decreases the resonance frequencies particularly on high-order modes. However, dislocating of tip position has an inverse effect that causes an increase in the resonance frequencies. In addition, it has been shown that the amplitude of the AFM microcantilever is affected by the influences of tip and its position. These effects are caused by the interaction between flexural and torsional motion due to the moment of inertia of the tip mass.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2009.05.016

Additional details

Identifiers

DOI
10.1016/j.ultramic.2009.05.016;
PII
S0304-3991(09)00121-1;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
109
Journal Issue
9
Journal Page Range
p. 1193-1202
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44102487
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
AMPLITUDES; ASYMMETRY; ATOMIC FORCE MICROSCOPY; BENDING; COUPLING; EXCITATION; MASS; MOMENT OF INERTIA; OSCILLATION MODES; RESONANCE; SENSITIVITY; TORSION
Descriptors DEC
DEFORMATION; ENERGY-LEVEL TRANSITIONS; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.