Published January 1, 2012
| Version v1
Journal article
Dependence of optical properties of vanadium oxide films on crystallization and temperature
- 1. Department of Physics, University of Ulsan, Ulsan 680-749 (Korea, Republic of)
- 2. Department of Physics, Kongju National University, Kongju 314-701 (Korea, Republic of)
- 3. Electronics and Communication Semiconductor Applications, Ulsan College, Ulsan 680-749 (Korea, Republic of)
Description
The optical properties of V2O5 and VO2 films prepared by a radio frequency sputtering were investigated using spectroscopic ellipsometry and measurement of transmittance. It was confirmed that the spectra of the complex refractive index of the V2O5 films are greatly affected by variations in crystalline structure. The spectra of the complex refractive index of the VO2 film showed remarkable change near transition temperature. This result indicates that the metal–insulator transition (MIT) in the VO2 film occurs around 68 °C, and the MIT is confirmed by measurement of the transmittance with temperature.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2011.11.028Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2011.11.028;
- PII
- S0040-6090(11)01998-5;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 520
- Journal Issue
- 6
- Journal Page Range
- p. 2368-2371
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43108709
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTALLIZATION; ELLIPSOMETRY; FILMS; METALS; REFRACTIVE INDEX; SPECTRA; SPUTTERING; TEMPERATURE DEPENDENCE; TRANSITION TEMPERATURE; VANADATES; VANADIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; ELEMENTS; MEASURING METHODS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.