Published October 1, 1996 | Version v1
Journal article Metadata-only

Formation of PdHg by reaction of palladium thin film contacts deposited onto mercuric iodide (α-HgI2) radiation detector crystals

Creators

  • 1. Sandia National Labs., Livermore, CA (United States)
  • 2. Carnegie-Mellon Univ., Pittsburgh, PA (United States). Dept. of Electrical and Computer Engineering
  • 3. TN Technologies, Inc., Round Rock, TX (United States)

Description

The microstructure and phase distribution of palladium thin films sputter deposited onto α-HgI2 for use as electrical contacts in radiation detectors are investigated using electron microscopy. Our results show a limited reaction to form palladium mercuride (PdHg). It is shown that the formation of PdHg via several reaction pathways is thermodynamically feasible. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
380
Journal Issue
1-2
Journal Page Range
p. 241-244.
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
9. international workshop on room temperature semiconductor X- and gamma-ray detectors, associated electronics and applications.
Dates
18-22 Sep 1995.
Place
Grenoble (France).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
28017231
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BINARY ALLOY SYSTEMS; DEPOSITION; ELECTRIC CONTACTS; ELECTRON DIFFRACTION; FREE ENERGY; HGI2 SEMICONDUCTOR DETECTORS; LATTICE PARAMETERS; MERCURY ALLOYS; MERCURY IODIDES; MICROSTRUCTURE; PALLADIUM; PALLADIUM ALLOYS; SPUTTERING; TETRAGONAL LATTICES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ALLOY SYSTEMS; ALLOYS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRICAL EQUIPMENT; ELECTRON MICROSCOPY; ELEMENTS; ENERGY; EQUIPMENT; FILMS; HALIDES; HALOGEN COMPOUNDS; IODIDES; IODINE COMPOUNDS; MEASURING INSTRUMENTS; MERCURY COMPOUNDS; MERCURY HALIDES; METALS; MICROSCOPY; PHYSICAL PROPERTIES; PLATINUM METAL ALLOYS; PLATINUM METALS; RADIATION DETECTORS; SCATTERING; SEMICONDUCTOR DETECTORS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS