Experimental and simulated VUV spectra from the JET tokamak and the reversed field pinch RFX
Description
Experimental VUV spectra from the JET tokamak and from the reversed field pinch RFX have been simulated. For the former device both n=2 to n=2 L-shell Ar and Ne spectra (respectively, in the 14.5-43.0 and in the 35.0-80.0 nm ranges) were considered, whereas for RFX only the Ne spectrum was available. The spectra have been observed with the SPRED spectrometer. From the simulation of the spectra, relative sensitivity curves have been obtained for each instrument in the ranges of the simulation. For RFX only, it has been possible to extend this curve from ∼13.0 to ∼105 nm, by simulating intrinsic C and O emissions. The photon emission coefficients of the lines with wavelengths in the ranges of the experimental spectra were obtained from collisional-radiative models. For Ar and Ne these coefficients have been calculated by the HULLAC atomic physics codes, whereas for C and O the corresponding coefficients have been taken from the ADAS database. Impurity modelling is performed using a one-dimensional impurity transport code, calculating for each atomic species the radial distribution of the impurity ions. (author)
Availability note (English)
Available from British Library Document Supply Centre- DSC:3829. 715695((01)20)Additional details
Publishing Information
- Publisher
- European Fusion Development Agreement
- Imprint Place
- Abingdon (United Kingdom)
- Imprint Pagination
- 28 p.; ill.; 30 cm; pbk.
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34022969
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- ARGON; EMISSION SPECTRA; FAR ULTRAVIOLET RADIATION; H CODES; JET TOKAMAK; NEON; PHOTON EMISSION; PLASMA IMPURITIES; REVERSE-FIELD PINCH; RFX DEVICE
- Descriptors DEC
- CLOSED PLASMA DEVICES; COMPUTER CODES; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; FLUIDS; GASES; IMPURITIES; NONMETALS; PINCH DEVICES; PINCH EFFECT; RADIATIONS; RARE GASES; REVERSED-FIELD PINCH DEVICES; SPECTRA; THERMONUCLEAR DEVICES; TOKAMAK DEVICES; TOROIDAL PINCH DEVICES; ULTRAVIOLET RADIATION
Optional Information
- Contract/Grant/Project number
- Publisher's no. EFDA-JET-PR (01)20
- Notes
- Includes bibliographical references