On the morphology of the strengthening phase in dispersion-strengthened compositions

Structural peculiarities of fiom dispersion-strengthened Ni-SiO and Cu-SiO compositions approximately 20 μm thick, containing up to 5:6 vol % of silicon oxide, are investigated by the method of X-ray diffractometry and small -angle scattering of X-rays. It isshown, that SiO impurities are not dissolved in the crystallin lattice, but they are chaotically distributed in the condensate volume in the form of separate inclusions, having uniaxial form. A change of volumetric content of the second phase within the studied concentration range does not affect the average size of SiO particles, which constitutes approximately 150 A for Ni-SiO and it is almost twice as hiqh for Cu-SiO. Deposition temperature increase is shown to result in a noticeable particle enlargement at preserving uniaxial form