Pulsed gate sweep strategies for hysteresis reduction in carbon nanotube transistors for low concentration NO2 gas detection
Creators
- 1. Micro and Nanosystems, Department of Mechanical and Process Engineering, ETH Zurich, CH-8092 Zurich (Switzerland)
- 2. Siemens AG, Corporate Technology, D-81730 Munich (Germany)
Description
Carbon-nanotube-based field effect transistors (CNFETs) have been employed as highly sensitive chemical sensors. Often used as the sensor output signal, the gate threshold voltage (Vth) is subject to concentration-dependent shifts upon exposure to target analytes. However, an unambiguous determination of the intrinsic Vth is usually hampered by substantial hysteresis in CNFET gate characteristics. In this study we show that short gate voltage (Vgd) pulses can be used for hysteresis reduction in CNFETs as chemical sensors, in particular for NO2 detection. In the pulsed operation regime, even small shifts of Vth upon sub-ppm NO2 exposure remain resolvable. Furthermore, the hysteretic behaviour is systematically investigated by varying the pulse waveforms and timing parameters. Finally, we use an adapted hysteresis model for pulsed Vgd and employ it to discuss the measurement data.
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-4484/21/18/185501Additional details
Identifiers
- DOI
- 10.1088/0957-4484/21/18/185501;
- PII
- S0957-4484(10)41827-9;
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 21
- Journal Issue
- 18
- Journal Page Range
- [9 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43024559
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CARBON; DETECTION; ELECTRIC POTENTIAL; FIELD EFFECT TRANSISTORS; HYSTERESIS; NANOTUBES; NITROGEN DIOXIDE; PULSES; REDUCTION; SENSORS; SIGNALS; WAVE FORMS
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; ELEMENTS; NANOSTRUCTURES; NITROGEN COMPOUNDS; NITROGEN OXIDES; NONMETALS; OXIDES; OXYGEN COMPOUNDS; SEMICONDUCTOR DEVICES; TRANSISTORS