X-ray fluorescence spectroscopy using Indus-2 facility

X-Ray fluorescence (XRF) spectroscopy is a powerful non-destructive method for elemental characterization of materials at the micro and trace levels. X-ray fluorescence microscopy, micro-tomography, con-focal X-ray fluorescence microscopy for assessing the 3-dimensional distribution of elements in a specimen, etc. are just a few of the fascinating applications of XRF that have been made possible by the availability of synchrotron radiation sources. In this presentation, a microfocus XRF beamline (BL-16) that was developed on the Indus-2 synchrotron facility will be discussed, along with its prospective applications in the field of materials science and engineering. (author)