Published August 2010
| Version v1
Journal article
Evidence for and calculation of micro-strain in porous synthetic cordierite
- 1. Corning SAS, Materials, CETC, 7 bis, Avenue de Valvins, F-77210 Avon (France)
- 2. Corning OOO, Modeling and Simulation, CSC, 29 Liter A Shatelena Str., St. Petersburg, 194021 (Russian Federation)
- 3. Los Alamos National Laboratory, LANSCE, Los Alamos, NM 87545 (United States)
Description
Following a preceding work on cordierite thermal expansion, high temperature neutron diffraction has allowed observation of lattice strain with temperature in extruded porous cordierite in the form of a rod. The temperature dependence of the grain microstress in the rod was determined from neutron diffraction data (by comparison with powder data) and from the macroscopic thermal expansion (by the integrity factor model). The two methods are in good agreement.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2010.04.008Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2010.04.008;
- PII
- S1359-6462(10)00252-6;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 63
- Journal Issue
- 3
- Journal Page Range
- p. 285-288
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45024357
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM SILICATES; COMPARATIVE EVALUATIONS; IRON COMPOUNDS; MAGNESIUM COMPOUNDS; NEUTRON DIFFRACTION; ORTHORHOMBIC LATTICES; POROUS MATERIALS; POWDERS; RODS; STRAINS; TEMPERATURE DEPENDENCE; THERMAL EXPANSION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; ALUMINIUM COMPOUNDS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; EVALUATION; EXPANSION; MATERIALS; OXYGEN COMPOUNDS; SCATTERING; SILICATES; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.