Published January 1, 2005
| Version v1
Journal article
Quantifying hidden defect in multi-layered structures by using eddy current system combined with a scanner
Creators
- 1. Department of Control Science and Engineering, Zhejiang University (China)
- 2. Institute of Advanced Manufacturing Engineering, Zhejiang University (China)
Description
The eddy current testing forward model of scanning inspection of multi-layered structures is introduced and simulation work is carried out to reveal the interaction between the scanning coil and defects with different geometric properties. A multi-frequency ECT experimental instrument combined with a scanner is established and scanning inspections are performed to detect the artificial etched flaws with different geometric parameters in the multi-layered structures. The predicted signals by the forward model are compared with the measured signals and the defects are characterized
Availability note (English)
Available online at http://stacks.iop.org/1742-6596/13/385/jpconf5_13_088.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 13
- Journal Issue
- 1
- Journal Page Range
- p. 385-388
- ISSN
- 1742-6596
Conference
- Title
- 7. international symposium on measurement technology and intelligent instruments
- Dates
- 6-8 Sep 2005
- Place
- Huddersfield (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36111595
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEFECTS; EDDY CURRENT TESTING; INSPECTION; MEASURING METHODS; SIGNALS; SIMULATION
- Descriptors DEC
- ELECTROMAGNETIC TESTING; MATERIALS TESTING; NONDESTRUCTIVE TESTING; TESTING