Published September 3, 1984
| Version v1
Patent
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X-ray diffractometer
Description
This invention relates to an X-ray diffractometer with a high focusing precision. Movements of a crystal sample with respect to the beam direction can be carried out without change in the sample-detector distance. The construction makes use of different cylinders rolling over each other. (G.J.P.)
Availability note (English)
MF available from INIS under the Report Number.Files
17047749.pdf
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Additional details
Additional titles
- Original title (Dutch)
- Roentgen analyse apparaat
Publishing Information
- Imprint Pagination
- 14 p.
- IPC:
- Int. Cl. G01N23/20.
- IPC
- Int. Cl. G01N23/20.
- Patent number
- NL patent document 8300420/A/
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 17047749
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ACCURACY; CONSTRUCTION; CRYSTALLOGRAPHY; FOCUSING; SAMPLE HOLDERS; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- DIFFRACTOMETERS; MEASURING INSTRUMENTS
Optional Information
- Notes
- 5 figs.