Published September 1973
| Version v1
Journal article
Current state of the art in semiconductor detectors
Creators
- 1. Commission of the European Communities, Ispra (Italy). Joint Nuclear Research Center
Description
no abstract available
Additional details
Identifiers
Publishing Information
- Journal Title
- Nuclear Instruments and Methods
- Journal Volume
- 112
- Journal Issue
- 1-2
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 219-228
- ISSN
- 0029-554X
Conference
- Title
- 1. international summer school on radionuclide metrology.
- Dates
- 21 Aug 1972.
- Place
- Herceg Novi, Yugoslavia.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 5112776
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CADMIUM COMPOUNDS; ENERGY RESOLUTION; ENERGY SPECTRA; GALLIUM COMPOUNDS; GAMMA SPECTRA; GERMANIUM; LI-DRIFTED GE DETECTORS; LI-DRIFTED SI DETECTORS; MERCURY IODIDES; SILICON CARBIDES; X-RAY SPECTRA
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; ELEMENTS; GE SEMICONDUCTOR DETECTORS; HALIDES; HALOGEN COMPOUNDS; IODIDES; IODINE COMPOUNDS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; MERCURY COMPOUNDS; METALS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SILICON COMPOUNDS; SPECTRA
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent