Interface formation and bond strength in 3Y-TZP/Cr composite bilayers produced by sinter-joining
- 1. Department of Materials Science and Engineering, P.O. Box: 11365-9466, Sharif University of Technology, 14588 Tehran (Iran, Islamic Republic of)
- 2. Institute for Nanoscience and Nanotechnology (INST), P.O. Box: 11365-9466, Sharif University of Technology, 14588 Tehran (Iran, Islamic Republic of)
- 3. Shock Wave and Condensed Matter Research Center, Kumamoto University, 2-39-1 Kurokami, Kumamoto City (Japan)
- 4. Faculty of Engineering, Kumamoto University, 2-39-1 Kurokami, Kumamoto City (Japan)
Description
The mechanism of interface formation during sinter-joining of nanostructured yttria stabilized zirconia (27 nm) compacts with chromium powder was investigated. The effect of sintering atmosphere, i.e. argon or vacuum, was studied. Microstructural evaluation and phase formation was examined by scanning electron microscopy (SEM), electron probe micro-analysis (EPMA), and micro-focused X-ray diffraction (MFXRD) methods. It is shown that spreading and evaporation-condensation mechanisms are responsible for the interface formation. An improved joint shear-strength was obtained after sintering in vacuum (74 MPa) compared with argon (41 MPa). The result of MFXRD indicated formation of Cr-island at the interface. No reaction between Cr and zirconia to form a new phase was noticed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.msea.2009.09.037Additional details
Identifiers
- DOI
- 10.1016/j.msea.2009.09.037;
- PII
- S0921-5093(09)01084-3;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 527
- Journal Issue
- 3
- Journal Page Range
- p. 449-453
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44009998
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ARGON; CHROMIUM; ELECTRON MICROPROBE ANALYSIS; INTERFACES; LAYERS; MICROSTRUCTURE; NANOSTRUCTURES; POWDERS; SCANNING ELECTRON MICROSCOPY; SHEAR PROPERTIES; SINTERING; X-RAY DIFFRACTION; YTTRIUM OXIDES; ZIRCONIUM OXIDES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FABRICATION; FLUIDS; GASES; MECHANICAL PROPERTIES; METALS; MICROANALYSIS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; RARE GASES; SCATTERING; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS; YTTRIUM COMPOUNDS; ZIRCONIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.