Published September 1999 | Version v1
Journal article

Low-temperature X-ray diffraction studies of thermal expansion in LiB3O5 single crystals

  • 1. Institute of Solid State and Semiconductor Physics, Belarussian Academy of Sciences, ul. P. Brovki 17, Minsk, 220072 (Belarus)

Description

Lattice parameters of a nonlinear optical LiB3O5 crystal were measured by X-ray diffraction method in the temperature range 80-300 K. The values of thermal expansion coefficients along the main crystallographic axes were determined from the temperature dependence of the crystallographic parameters. A pronounced anisotropy in thermal expansion was established in the temperature range studied

Additional details

Publishing Information

Journal Title
Crystallography Reports
Journal Volume
44
Journal Issue
5
Journal Page Range
p. 844-846
ISSN
1063-7745
CODEN
CYSTE3

Optional Information

Notes
Translated from Kristallografiya, ISSN 0023-4761, 44, 905-907 (September-October 1999); (c) 1999 MAIK/Interperiodika