Investigation of the effect of manganese stress on the mineral content of the leaves of wheat seedling by synchrotron radiation X-ray fluorescence spectroscopy

The present study describes the potential of the synchrotron radiation-based X-ray fluorescence spectroscopy technique for the investigation of the changes in the elemental profile of the wheat seedlings stressed by excess manganese. For this, X-ray fluorescence spectra of the leaves of the control and manganese treated wheat seedlings have been recorded by synchrotron radiation X-ray of energy 15 keV. The analyses of the recorded spectra show the presence of elements as chlorine, potassium, calcium, manganese, copper, iron, nickel and zinc. A calibration free approach, PyMca has been used for the quantitative estimation of the detected elements in the leaves of the control and manganese treated wheat seedlings. The excess supply of manganese to wheat seedlings results in the accumulation of manganese in the leaves of the seedlings. The accumulation of manganese in wheat seedlings negatively affects the uptake and translocation of calcium, potassium and iron while it has stimulating effect on the uptake of copper and zinc. The study demonstrates the potential of synchrotron radiation X-ray fluorescence technique for the rapid, sensitive, user friendly and simultaneous monitoring of the changes arising in the mineral profile in the plants stressed with heavy metals. (author)