Published March 1984 | Version v1
Journal article

Photon intensity and polarization of channeling radiation emitted by 56 MeV positrons in a silicon single crystal

  • 1. Okayama Coll. of Science (Japan). Dept. of Applied Physics
  • 2. Waseda Univ., Tokyo (Japan). Dept. of Physics

Description

The channeling radiation and its polarization emitted by 56 MeV positrons in a Si crystal have been studied by computer simulation. The photon spectrum of the (111) planar channeling was found to have two peaks which correspond to the wide (111) channel and the narrow (111) channel of an Si crystal with the diamond structure, respectively. The photon spectrum of the [110] axial channeling has three peaks. The first peak is the superposition of the (100), (110), and (111) planar channeling radiations, the second peak corresponds to the narrow (111) planar channeling, and the third peak is due to the radiation from the [110] axial channeling. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res., Sect. B
Journal Volume
230
Journal Issue
1-3
Series
CODEN: NIMBE.;Nucl. Instrum. Methods Phys. Res., Sect. B.
Journal Page Range
108-111
ISSN
0168-583X

Conference

Title
10. international conference on atomic collisions in solids.
Dates
18-22 Jul 1983.
Place
Bad Iburg (Germany, F.R.).

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
15065281
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
COMPUTERIZED SIMULATION; ELECTROMAGNETIC RADIATION; EMISSION SPECTRA; EXPERIMENTAL DATA; MEV RANGE 10-100; ORIENTATION; POLARIZATION; POSITRON CHANNELING; SILICON; THEORETICAL DATA
Descriptors DEC
CHANNELING; DATA; ELEMENTS; ENERGY RANGE; INFORMATION; MEV RANGE; NUMERICAL DATA; RADIATIONS; SEMIMETALS; SIMULATION; SPECTRA