Published June 2014 | Version v1
Journal article

Atom probe tomography of lithium-doped network glasses

  • 1. Institute of Materials Physics, University of Münster, Wilhelm-Klemm-Str. 10, D-48149 Münster (Germany)
  • 2. Institute of Material Science, University of Stuttgart, Heisenberg Straße 3, D-70569 Stuttgart (Germany)

Description

Li-doped silicate and borate glasses are electronically insulating, but provide considerable ionic conductivity. Under measurement conditions of laser-assisted atom probe tomography, mobile Li ions are redistributed in response to high electric fields. In consequence, the direct interpretation of measured composition profiles is prevented. It is demonstrated that composition profiles are nevertheless well understood by a complex model taking into account the electronic structure of dielectric materials, ionic mobility and field screening. Quantitative data on band bending and field penetration during measurement are derived which are important in understanding laser-assisted atom probe tomography of dielectric materials. - Highlights: • Atom probe tomography is performed on ion conducting glasses. • Redistribution of ions during the measurement is observed. • An electrostatic model is applied to describe the electric field and ion diffusion. • Measurement is conducted of the absolute temperature during laser pulses

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2014.03.007

Additional details

Identifiers

DOI
10.1016/j.ultramic.2014.03.007;
PII
S0304-3991(14)00052-7;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
141
Journal Page Range
p. 51-55
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.