Atom probe tomography of lithium-doped network glasses
- 1. Institute of Materials Physics, University of Münster, Wilhelm-Klemm-Str. 10, D-48149 Münster (Germany)
- 2. Institute of Material Science, University of Stuttgart, Heisenberg Straße 3, D-70569 Stuttgart (Germany)
Description
Li-doped silicate and borate glasses are electronically insulating, but provide considerable ionic conductivity. Under measurement conditions of laser-assisted atom probe tomography, mobile Li ions are redistributed in response to high electric fields. In consequence, the direct interpretation of measured composition profiles is prevented. It is demonstrated that composition profiles are nevertheless well understood by a complex model taking into account the electronic structure of dielectric materials, ionic mobility and field screening. Quantitative data on band bending and field penetration during measurement are derived which are important in understanding laser-assisted atom probe tomography of dielectric materials. - Highlights: • Atom probe tomography is performed on ion conducting glasses. • Redistribution of ions during the measurement is observed. • An electrostatic model is applied to describe the electric field and ion diffusion. • Measurement is conducted of the absolute temperature during laser pulses
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2014.03.007Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2014.03.007;
- PII
- S0304-3991(14)00052-7;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 141
- Journal Page Range
- p. 51-55
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46023926
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BENDING; CARRIER MOBILITY; DIELECTRIC MATERIALS; DIFFUSION; DOPED MATERIALS; ELECTRONIC STRUCTURE; GLASS; IONIC CONDUCTIVITY; LASERS; LITHIUM; LITHIUM IONS; PROBES; SILICATES; TOMOGRAPHY
- Descriptors DEC
- ALKALI METALS; CHARGED PARTICLES; DEFORMATION; DIAGNOSTIC TECHNIQUES; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; IONS; MATERIALS; METALS; MOBILITY; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.