Topography of perovskite by means of atomic force microscopy

Solar cells are source of clean energy. They production of Si cells is however expensive. Perovskite are inorganic-organic a compounds cheaper alternative solar cells. Quality of this solar cell depends on homogeneity of perovskite structure. Suitable homogeneous of structure depends on a method of production perovskite layer. One of these methods is a solution method which results are tested. Structure of layer can be estimated based on topography of surface. Instrument for analysis topography surface is atomic force microscopy. This method uses interaction between surface and nano-type. We are prepared on glass and plasma modified glass perovskite layers. Structure of layers is more homogeneous on modified substrate than on ordinary glass. Modified substrate is better for production of solar cells might be eventually. (authors)