Published December 2010
| Version v1
Journal article
Surface tension of micellar block copolymer films
- 1. Sogang University, Seoul (Korea, Republic of)
- 2. Argonne National Laboratory, Argonne, Illinois (United States)
- 3. Korea Basic Science Institute, Jeonju Center, Jeonju (Korea, Republic of)
Description
Surface tensions of micellar block copolymers of poly(styrene-b-dimethylsiloxane) (PS-b-PDMS) films are obtained by X-ray diffuse scattering. PS-b-PDMS films on Si substrates with the thicknesses from 36 to 588 nm were investigated at temperatures of 30 - 215 .deg. C. The surface tension reflects the concentration of PDMS micelles which are preferably located at the surface. The molar fraction of PDMS micelles near the surface is estimated by using angle-resolved X-ray photoelectron spectroscopy.
Additional details
Publishing Information
- Journal Title
- Journal of the Korean Physical Society
- Journal Volume
- 57
- Journal Issue
- 6
- Series
- 12 refs, 4 figs
- Journal Page Range
- p. 1412-1415
- ISSN
- 0374-4884
INIS
- Country of Publication
- Korea, Republic of
- Country of Input or Organization
- Korea, Republic of
- INIS RN
- 44121250
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COPOLYMERS; DIFFUSE SCATTERING; FILMS; MICELLAR SYSTEMS; SILICON; SURFACE TENSION; THICKNESS; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SOURCES
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELECTRON SPECTROSCOPY; ELEMENTS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PHOTOELECTRON SPECTROSCOPY; POLYMERS; RADIATION SOURCES; SCATTERING; SEMIMETALS; SPECTROSCOPY; SURFACE PROPERTIES