Published May 2019 | Version v1
Journal article

Raman spectroscopy and X-ray photo-spectroscopy analysis of graphite media irradiated at low doses

  • 1. Department of Physics, University of Surrey, Guildford, GU2 7XH (United Kingdom)
  • 2. Sunway University, Centre for Biomedical Physics, Jalan Universiti, 47500, Subang Jaya (Malaysia)
  • 3. Department of Physics, Faculty of Science, University of Malaya, Kuala Lumpur, 50603 (Malaysia)
  • 4. Dept. of Physics, Princess Nourah Bint Abdulrahman University, Riyadh (Saudi Arabia)
  • 5. Synchrotron Light Research Institute of Thailand and Suranaree University of Technology, 111 University Ave, Muang, Nakhon Ratchasima, 30000 (Thailand)

Description

Highlights: • Low-dose photon irradiations used in initiating structural alteration in carbon-rich materials. • Analysed via Raman and X-ray photo-spectroscopy, providing analysis of dose dependence. • Order-disorder via defect creation and annealing as competing dominant effects across dose range. • O1s/C1s ratio a potential parameter for dose dependent damage analysis in graphite. - Abstract: We explore the utility of controlled low-doses (0.2–100 Gy) of photon irradiation as initiators of structural alteration in carbon-rich materials. To-date our work on carbon has focused on β-, x- and γ-irradiations and the monitoring of radiotherapeutic doses (from a few Gy up to some tens of Gy) on the basis of the thermoluminescence (TL) signal, also via Raman and X-ray photo-spectroscopy (XPS), providing analysis of the dose dependence of single-walled carbon nanotubes (SWCNT). The work has been extended herein to investigate possibilities for analysis of structural alterations in graphite-rich mixtures, use being made of two grades of graphite-rich pencil lead, 8H and 2B, both being in the form produced for mechanical pencils (propelling or clutch pencils). 2B has the greater graphite content (approaching 98 wt %), 8H being a mixture of C, O, Al and Si (with respective weight percentages 39.2, 38.2, 9.8 and 12.8). Working on media pre-annealed at 400 °C, both have subsequently been irradiated to penetrating photon-mediated doses. Raman spectroscopy analysis has been carried out using a 532 nm laser Raman spectrometer, while for samples irradiated to doses from 1 to 40 Gy, XPS spectra were acquired using Al Kα sources (hv ∼1400 eV); carbon KLL Auger peaks were acquired using 50 eV Pass Energy. At these relatively low doses, alterations in order-disorder are clearly observed, defect generation and internal annealing competing as dominating effects across the dose range.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apradiso.2019.02.016

Additional details

Identifiers

DOI
10.1016/j.apradiso.2019.02.016;
PII
S0969804318311898;

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
147
Journal Page Range
p. 105-112
ISSN
0969-8043
CODEN
ARISEF

Optional Information

Notes
© 2019 Elsevier Ltd. All rights reserved.