Absolute frequency measurements with a robust, transportable 40Ca+ optical clock
Creators
- 1. Key Laboratory of Atomic Frequency Standards, Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan 430071 (China)
- 2. State Key Laboratory of Magnetic Resonance and Atomic and Molecular Physics, Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan 430071 (China)
- 3. 3 University of Chinese Academy of Sciences, Beijing 100049 (China)
- 4. National Institute of Metrology, Beijing 100029 (China)
- 5. Wuhan Institute of Quantum Technology, Wuhan 430206 (China)
Description
We constructed a transportable 40Ca+ optical clock (with an estimated minimum systematic shift uncertainty of 1.3 x 10-17 and a stability of 5 x 10-15/√τ) that can operate outside the laboratory. We transported it from the Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan to the National Institute of Metrology, Beijing. The absolute frequency of the 729 nm clock transition was measured for up to 35 d by tracing its frequency to the second of International System of Units. Some improvements were implemented in the measurement process, such as the increased effective up-time of 91.3% of the 40Ca+ optical clock over a 35-day-period, the reduced statistical uncertainty of the comparison between the optical clock and hydrogen maser, and the use of longer measurement times to reduce the uncertainty of the frequency traceability link. The absolute frequency measurement of the 40Ca+ optical clock yielded a value of 411 042 129 776 400.26 (13) Hz with an uncertainty of 3.2 x 10-16, which is reduced by a factor of 1.7 compared with our previous results. As a result of the increase in the operating rate of the optical clock, the accuracy of 35 d of absolute frequency measurement can be comparable to the best results of different institutions in the world based on different optical frequency measurements. (author)
Availability note (English)
Available from doi: http://dx.doi.org/10.1088/1681-7575/acd05dAdditional details
Identifiers
Publishing Information
- Journal Title
- Metrologia
- Journal Volume
- 60
- Journal Issue
- no.3
- Journal Page Range
- p. 035004.1-035004.11
- ISSN
- 0026-1394
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 55011991
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- FREQUENCY MEASUREMENT; HYDROGEN; MASERS; METROLOGY
- Descriptors DEC
- AMPLIFIERS; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; MICROWAVE AMPLIFIERS; MICROWAVE EQUIPMENT; NONMETALS
Optional Information
- Notes
- 46 refs.