Published January 2009
| Version v1
Journal article
Characterization of oxide layers formed on electrochemically treated Ti by using soft X-ray absorption measurements
Creators
- 1. University of Saskatchewan, Department of Physics and Engineering Physics, 116 Science Place, Saskatoon, SK, S7N 5E2 (Canada)
- 2. Federal University of Rio de Janeiro, Metallurgy and Materials Engineering/COPPE, P.O. Box 68505, 21941-972 Rio de Janeiro, RJ (Brazil)
- 3. Institute of Metal Physics, Russian Academy of Sciences - Ural Division, 620219 Yekaterinburg GSP-170 (Russian Federation)
- 4. Federal University of Parana, Department of Physics, P.O. Box 19044, 81531-990, Curitiba, PR (Brazil)
Description
The oxide layers of electrolytic oxidized titanium (Ti) were characterized using Ti L2,3 and O K edge X-ray absorption. The spectra show that the structure of the oxide layers that are formed during a 1 min treatment are dependent on the concentration of the electrolyte (H2SO4 or Na2SO4) with which the Ti surface was treated, and also on the magnitude of the potential that was applied during the anodic oxidation process (100 V or 150 V). It is found that a potential of 150 V and an electrolyte concentration of 0.5 M or 1.0 M produces a layer of TiO2 having rutile crystal structure
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2008.11.001Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2008.11.001;
- PII
- S0368-2048(08)00144-8;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 169
- Journal Issue
- 1
- Journal Page Range
- p. 46-50
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40047071
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ELECTROCHEMISTRY; ELECTROLYTES; LAYERS; OXIDATION; RUTILE; SODIUM SULFATES; SOFT X RADIATION; SULFURIC ACID; TITANIUM OXIDES; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; CHEMISTRY; ELECTROMAGNETIC RADIATION; HYDROGEN COMPOUNDS; INORGANIC ACIDS; INORGANIC COMPOUNDS; IONIZING RADIATIONS; MATERIALS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; RADIOACTIVE MATERIALS; RADIOACTIVE MINERALS; SODIUM COMPOUNDS; SPECTRA; SPECTROSCOPY; SULFATES; SULFUR COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.