Soudan 2 data acquisition and trigger electronics
Description
The 1.1 kton Soudan 2 detector is read out by 16K anode wires and 3 2K cathode strips. Preamps from each wire or strip are bussed together in groups of 8 to reduce the number of ADC channels. The resulting 6144 channels of ionization signal are flash-digitized every 150 ns and stored in RAM. The raw data hit patterns are continually compared with programmable trigger multiplicity and adjacency conditions. The data acquisition process is managed in a system of 24 parallel crates each containing an Intel 8086 microprocessors, which supervises a pipe-lined data compactors, and allows transfer of the compacted data via CAMAC to the host computer. The 8086's also manage the local trigger conditions and can perform some parallel processing of the data. Due to the scale of the system and multiplicity of identical channels, semi-custom gate array chips are used for much of the logic, utilizing 2.5 micron CMOS technology
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS, PC A02/MF A01; 1 as DE85013864.Files
17005369.pdf
Files
(243.2 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:9d2328ed3efdc1bf10aeed648e80bde9
|
243.2 kB | Preview Download |
Additional details
Publishing Information
- Imprint Pagination
- 5 p.
- Report number
- CONF-850579--3
Conference
- Title
- 4. topical conference on computerized data acquisition in particle and nuclear physics.
- Dates
- 19-24 May 1985.
- Place
- Chicago, IL (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17005369
- Subject category
- S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CAMAC SYSTEM; DATA ACQUISITION SYSTEMS; MICROPROCESSORS; NUCLEONS; OPERATION; PARALLEL PROCESSING; PRINTED CIRCUITS; PROPORTIONAL COUNTERS; READOUT SYSTEMS; TRIGGER CIRCUITS; WEAK PARTICLE DECAY
- Descriptors DEC
- BARYONS; DECAY; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; PARTICLE DECAY; PROGRAMMING; PULSE CIRCUITS; RADIATION DETECTORS