Published July 8, 2009
| Version v1
Journal article
The 473 K isothermal section of the Cu-Ti-Sn ternary system
- 1. Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Guangxi University, Nanning, Guangxi 530004 (China)
Description
The phase relationships of the Cu-Ti-Sn ternary system at 473 K have been investigated mainly by means of X-ray powder diffraction (XRD), scanning electron microscopy (SEM), optical microscopy (OM) and differential thermal analysis (DTA). The isothermal section consists of 17 single-phase regions, 33 two-phase regions and 17 three-phase regions. The existence of 12 binary compounds and 2 ternary compounds, namely Cu4Ti, Cu3Ti2, Cu4Ti3, CuTi, CuTi2, Cu3Sn, Cu6Sn5, Ti3Sn, Ti2Sn, Ti5Sn3, Ti6Sn5, Ti2Sn3, CuTi5Sn3 and CuTiSn, are confirmed in the Cu-Ti-Sn ternary system at 473 K. No new ternary compound is found. The maximum solid solubility of Cu in Ti6Sn5 was approximately 10 at.% Cu.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2009.02.074Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2009.02.074;
- PII
- S0925-8388(09)00329-6;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 480
- Journal Issue
- 2
- Journal Page Range
- p. 382-385
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41051413
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COBALT ALLOYS; DIFFERENTIAL THERMAL ANALYSIS; OPTICAL MICROSCOPY; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; SOLUBILITY; TEMPERATURE RANGE 0400-1000 K; TIN ALLOYS; TITANIUM ALLOYS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; ELECTRON MICROSCOPY; INFORMATION; MICROSCOPY; SCATTERING; TEMPERATURE RANGE; THERMAL ANALYSIS; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.