Coexistence of rhombohedral and orthorhombic phases in ultrathin BiFeO3 films driven by interfacial oxygen octahedral coupling
Creators
- 1. University of Chinese Academy of Sciences, Yuquan Road 19, 100049 Beijing (China)
- 2. Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Wenhua Road 72, 110016 Shenyang (China)
- 3. School of Physics, Nankai University, Weijin Road 94, 300071 Tianjin (China)
- 4. School of Materials Sciences and Engineering, Lanzhou University of Technology, Langongping Road 287, 730050 Lanzhou (China)
Description
Coexistence of two phases creates a morphotropic phase boundary in perovskite oxides, which can provide large piezoelectric response, generating it a well suited system for probe-based memories and actuator applications. The coexistence of two phases in thin films is proposed to be induced by epitaxial constraints from substrates or chemical compositional modifications by substitution. In this work, we found a new formation mechanism of two-phase coexistence driven by interfacial oxygen octahedral coupling (OOC) in oxide heterostructures. We fabricated a series of BiFeO3 (BFO) ultrathin films on various orthorhombic substrates exerting from tensile to compressive strains by Pulsed Laser Deposition (PLD) techniques. Aberration-corrected transmission electron microscopy demonstrates that the lattice rotation and oxygen octahedral rotation (OOR) patterns transfer from these substrates to BFO films in about 3 unit cells while an orthorhombic (Pnma) phase forms at the interface due to OOC. This Pnma phase is non-polar, which differs from polar phases of Ima2 or Pmc21 when a large tensile strain is imposed onto BFO. First-principles calculations reproduce these experimental results perfectly. This phase transition occurs when BFO films are under both tensile and compressive strains suggesting that OOC alone can induce phase transition in ultrathin BFO films. Such coexistence of two phases may have many potential applications in the field of electronics, such as ferroelectric sensors and actuators.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.actamat.2017.12.038Additional details
Identifiers
- DOI
- 10.1016/j.actamat.2017.12.038;
- PII
- S1359645417310509;
Publishing Information
- Journal Title
- Acta Materialia
- Journal Volume
- 145
- Journal Page Range
- p. 220-226
- ISSN
- 1359-6454
- CODEN
- ACMAFD
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49095391
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COUPLING; ENERGY BEAM DEPOSITION; FERROELECTRIC MATERIALS; LASER RADIATION; ORTHORHOMBIC LATTICES; OXIDES; OXYGEN; PHASE TRANSFORMATIONS; PULSED IRRADIATION; STRAINS; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TRIGONAL LATTICES
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DEPOSITION; DIELECTRIC MATERIALS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; IRRADIATION; MATERIALS; MICROSCOPY; NONMETALS; OXYGEN COMPOUNDS; RADIATIONS; SURFACE COATING; THREE-DIMENSIONAL LATTICES
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.