Control on wetting properties of spin-deposited silica films by surface silylation method
Creators
- 1. Air Glass Laboratory, Department of Physics, Shivaji University, Kolhapur 416 004, Maharashtra (India)
- 2. Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522 (Japan)
- 3. CSR, Indore Centre, University Campus, Khandwa Road, Indore 452 017, Madhyapradesh (India)
- 4. Applied Physics Division, Bhabha Atomic Research Centre (BARC), Trombay, Mumbai 400 085 (India)
Description
Control on the wettability of solid materials by liquid is a classical and key issue in surface engineering. Optically transparent water-repellent silica films have been spin-deposited on glass substrates at room temperature (∼27 deg. C). The wetting behavior of silica films was controlled by surface silylation method using dimethylchlorosilane (DMCS) as a silylating reagent. A coating sol was prepared by keeping the molar ratio of methyltrimethoxysilane (MTMS) precursor, methanol (MeOH) solvent, water (H2O) constant at 1:8.8:2.64 respectively, with 4 M NH4OH as a catalyst throughout the experiments and the amount of DMCS in hexane was varied from 0 to 12 vol.%. It was found that with an increase in vol.% of DMCS, the water contact angle values of the films increased from 78 deg. to 136 deg. At 12 vol.% of DMCS, the film shows static water contact angle as high as 136 deg. and water sliding angle as low as 18 deg. The hydrophobic silica films retained their water repellency up to a temperature 295 deg. C and above this temperature the films show superhydrophilic behavior. These results are compared with our earlier research work done on silylation of silica surface using hexamethyldisilazane (HMDZ) and trimethylchlorosilane (TMCS). The hydrophobic silica films were characterized by taking into consideration the Fourier transform infrared (FT-IR) spectroscopy, thermo gravimetric-differential thermal (TG-DT) analyses, scanning electron microscopy (SEM), atomic force microscopy (AFM), % of optical transmission, thermal and chemical aging tests, humidity tests, static and dynamic water contact angle measurements.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.09.057Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.09.057;
- PII
- S0169-4332(09)01336-1;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 256
- Journal Issue
- 7
- Journal Page Range
- p. 2115-2121
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44018452
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMMONIUM HYDROXIDES; ATOMIC FORCE MICROSCOPY; CATALYSTS; COATINGS; FILMS; FOURIER TRANSFORM SPECTROMETERS; GLASS; HUMIDITY; INFRARED SPECTRA; OPACITY; SCANNING ELECTRON MICROSCOPY; SILICA; SOL-GEL PROCESS; SUBSTRATES; SURFACES; TEMPERATURE RANGE 0273-0400 K; THERMAL GRAVIMETRIC ANALYSIS; TRANSMISSION; WETTABILITY
- Descriptors DEC
- AMMONIUM COMPOUNDS; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; GRAVIMETRIC ANALYSIS; HYDROGEN COMPOUNDS; HYDROXIDES; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; MOISTURE; OPTICAL PROPERTIES; OXIDE MINERALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; QUANTITATIVE CHEMICAL ANALYSIS; SPECTRA; SPECTROMETERS; TEMPERATURE RANGE; THERMAL ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.