Published August 2012 | Version v1
Journal article

High resolution two-dimensional dose mapping of electron beam processed polymers

  • 1. ETH Zurich, Integrated Systems Laboratory, Zurich (Switzerland)
  • 2. HUBER-SUHNER AG, Wire and Cable Division, R and D, Pfaeffikon (Switzerland)

Description

The recent advances in electron beam processing of polymer samples require increasingly dose mapping techniques with depth and volume resolution capability. In this paper, the use of micro-indentation and thermo-mechanical analysis is proposed to fulfill the necessary requirements in terms of resolution and accuracy. Experimental procedures are used to acquire mechanical data that are successively converted into dose levels based on dedicated calibrated samples. Physical principles, experimental artifacts, and limitations are discussed with special focus on calibration and validation of a simulator for dosimetry in electron beam cross-linking of electrical cables.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.radphyschem.2012.02.023

Additional details

Identifiers

DOI
10.1016/j.radphyschem.2012.02.023;
PII
S0969-806X(12)00108-9;

Publishing Information

Journal Title
Radiation Physics and Chemistry (1993)
Journal Volume
81
Journal Issue
8
Journal Page Range
p. 1270-1275
ISSN
0969-806X
CODEN
RPCHDM

Conference

Title
International meeting on radiation processing
Acronym
IMRP 16
Dates
13-16 Jun 2011
Place
Montreal, PQ (Canada)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43105712
Subject category
S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; COMPUTERIZED SIMULATION; CROSS-LINKING; DOSES; DOSIMETRY; ELECTRON BEAMS; MONTE CARLO METHOD; POLYMERS; RESOLUTION; SIMULATORS; TWO-DIMENSIONAL CALCULATIONS
Descriptors DEC
ANALOG SYSTEMS; BEAMS; CALCULATION METHODS; CHEMICAL REACTIONS; FUNCTIONAL MODELS; LEPTON BEAMS; PARTICLE BEAMS; POLYMERIZATION; SIMULATION

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.