Published August 2012
| Version v1
Journal article
High resolution two-dimensional dose mapping of electron beam processed polymers
Creators
- 1. ETH Zurich, Integrated Systems Laboratory, Zurich (Switzerland)
- 2. HUBER-SUHNER AG, Wire and Cable Division, R and D, Pfaeffikon (Switzerland)
Description
The recent advances in electron beam processing of polymer samples require increasingly dose mapping techniques with depth and volume resolution capability. In this paper, the use of micro-indentation and thermo-mechanical analysis is proposed to fulfill the necessary requirements in terms of resolution and accuracy. Experimental procedures are used to acquire mechanical data that are successively converted into dose levels based on dedicated calibrated samples. Physical principles, experimental artifacts, and limitations are discussed with special focus on calibration and validation of a simulator for dosimetry in electron beam cross-linking of electrical cables.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.radphyschem.2012.02.023Additional details
Identifiers
- DOI
- 10.1016/j.radphyschem.2012.02.023;
- PII
- S0969-806X(12)00108-9;
Publishing Information
- Journal Title
- Radiation Physics and Chemistry (1993)
- Journal Volume
- 81
- Journal Issue
- 8
- Journal Page Range
- p. 1270-1275
- ISSN
- 0969-806X
- CODEN
- RPCHDM
Conference
- Title
- International meeting on radiation processing
- Acronym
- IMRP 16
- Dates
- 13-16 Jun 2011
- Place
- Montreal, PQ (Canada)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43105712
- Subject category
- S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; COMPUTERIZED SIMULATION; CROSS-LINKING; DOSES; DOSIMETRY; ELECTRON BEAMS; MONTE CARLO METHOD; POLYMERS; RESOLUTION; SIMULATORS; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- ANALOG SYSTEMS; BEAMS; CALCULATION METHODS; CHEMICAL REACTIONS; FUNCTIONAL MODELS; LEPTON BEAMS; PARTICLE BEAMS; POLYMERIZATION; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.