Published October 15, 1975
| Version v1
Patent
Open
Technique for plasma parameter measurement
Creators
Description
A method is proposed of determining stationary plasma parameters by probing with an electromagnetic wave with the frequency less than the maximum plasma frequency and by detecting the probe wave phase variation. In order to determine the local density of an inhomogeneous plasma the electromagnetic wave frequency is modulated and the local density of plasma is determined from the phase shift
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Additional details
Additional titles
- Original title (Russian)
- Способ определения параметров плазмы
Publishing Information
- Imprint Pagination
- 3 p.
- IPC:
- Int. Cl. G01n23/24; H0Sh1/00.
- IPC
- Int. Cl. G01n23/24; H0Sh1/00.
- Patent number
- SU patent document 488124/A/
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 9353633
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- EQUILIBRIUM PLASMA; INHOMOGENEOUS PLASMA; LANGMUIR FREQUENCY; MICROWAVE RADIATION; MODULATION; PHASE SHIFT; PLASMA DIAGNOSTICS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; PLASMA; RADIATIONS
Optional Information
- Notes
- Filed 11 May 1973.