Published January 2016 | Version v1
Journal article

Defect structures of F82H irradiated at SINQ using positron annihilation spectroscopy

  • 1. Department of Mechanical Engineering, Graduate School of Science and Engineering, Kagoshima University, Korimoto, Kagoshima 890-0065 (Japan)
  • 2. Research Reactor Institute, Kyoto University, Kumatori-cho, Sennan-gun, Osaka 590-0494 (Japan)
  • 3. Spallation Neutron Source Division, Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland)

Description

The growth process of He-filled vacancy clusters during annealing was investigated with positron annihilation lifetime spectroscopy and coincidence Doppler broadening (CDB) measurements. The reduced activation ferritic/martensitic steel F82H was irradiated with high-energy protons and spallation neutrons. The He-filled vacancy clusters absorbed more He atoms when annealed below 673 K, and the long and mean positron lifetimes decreased. When annealed above 873 K, the vacancies (V)–Hem or Vn–Hem complexes dissociated (n and m are the number of vacancies and He atoms, respectively). The He-filled vacancy clusters then absorb these dissociated vacancies and He atoms. Therefore, the size of the He-filled vacancy clusters increased, and the He-to-vacancy ratio decreased. These annealing-induced phenomena increased the long positron lifetime in addition to the higher positron trapping rates of the He-filled vacancy clusters. By comparing electron-irradiated samples that did not contain He atoms to the proton- and neutron-irradiated samples containing He atoms, the effects of He atoms on the CDB ratio curves were studied. The results agreed with the previous study of He-ion-implanted Fe–Cr alloys.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2015.03.055

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2015.03.055;
PII
S0022-3115(15)00210-X;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
468
Journal Page Range
p. 281-284
ISSN
0022-3115
CODEN
JNUMAM

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.