Published October 10, 1989
| Version v1
Journal article
A station for studying solid-state chemical reactions by the Laue method
- 1. AN SSSR, Novosibirsk (USSR). Inst. of Solid State Chemistry
- 2. AN SSSR, Novosibirsk. Inst. Yadernoj Fiziki
Description
A station for studying solid-state chemical reactions by the X-ray diffraction Laue method is described. A two-coordinate position-sensitive X-ray detector is used as the registration device. In the reaction chamber the sample is kept at a controlled temperature and under pressure of a gaseous atmosphere (or vacuum). The possibility of investigating the kinetics during solid-state chemical reactions is shown for the example of crystal hydrate dehydration in vacuum. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research, Section A
- Journal Volume
- 282
- Journal Issue
- 2/3
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 695-697
- ISSN
- 0168-9002
- CODEN
- NIMAE
Conference
- Title
- 8. international conference on synchrotron radiation utilization (SR-8).
- Dates
- 18-22 Aug 1988.
- Place
- Novosibirsk (USSR).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 21008618
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM TRANSPORT; CHEMICAL ANALYSIS; CHEMICAL REACTION KINETICS; CHEMICAL REACTIONS; COLLIMATORS; DEAD TIME; DEHYDRATION; EFFICIENCY; LAUE METHOD; LITHIUM COMPOUNDS; MONOCRYSTALS; ORGANOMETALLIC COMPOUNDS; PHOTON BEAMS; POSITION SENSITIVE DETECTORS; POTASSIUM COMPOUNDS; RESPONSE FUNCTIONS; SI SEMICONDUCTOR DETECTORS; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES; TIME RESOLUTION; VEPP-3; X-RAY DETECTION; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; BEAMS; BREMSSTRAHLUNG; COHERENT SCATTERING; CRYSTALS; DETECTION; DIFFRACTION; DIFFRACTION METHODS; ELECTROMAGNETIC RADIATION; FUNCTIONS; KINETICS; MEASURING INSTRUMENTS; ORGANIC COMPOUNDS; RADIATION DETECTION; RADIATION DETECTORS; RADIATION SOURCES; RADIATIONS; REACTION KINETICS; RESOLUTION; SCATTERING; SEMICONDUCTOR DETECTORS; STORAGE RINGS; TIMING PROPERTIES