Published January 2019 | Version v1
Journal article

Bandgap of thin film solar cell absorbers: A comparison of various determination methods

  • 1. Laboratory for Thin Films and Photovoltaics, Empa - Swiss Federal Laboratories for Materials Science and Technology, Überlandstrasse 129, Dübendorf, CH-8600 (Switzerland)

Description

Highlights: • Comparison of different methods for the bandgap determination from EQE • Criteria for the choice of a method are given. • Effects of interference fringes on the bandgap determination are discussed. • Recommended methods: derivative (inflection point), (E EQE)2 and ERE integrand • Open source software released for the analysis of solar cells. -- Abstract: Knowledge of the absorber bandgap is often needed for assessing the junction quality of a thin film solar cell, for example when computing the open-circuit voltage deficit. The bandgap is typically estimated from the routine measurement of the external quantum efficiency (EQE) of finished devices. However the extraction becomes ambiguous in the case of very thin absorbers, or in presence of bandgap gradients or collection issues of charge carriers. This work reviews several methods for the determination of the bandgap from EQE measurements and discusses their validity conditions. The numerical results are compared based on experimental EQE of several different thin film solar cells such as CuInGaSe2, CuInSe2, CdTe, CuZnSnSe and perovskite, and systematic trends are identified. Numerical simulations are also performed to illustrate the behavior of the different bandgap extraction methods in presence of a bandgap gradient and different magnitudes of the exponential tail states.

Additional details

Identifiers

DOI
10.1016/j.tsf.2018.11.017;
PII
S0040609018307582;

Publishing Information

Journal Title
Thin Solid Films (Print)
Journal Volume
669
Journal Page Range
p. 482-486
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2018 Published by Elsevier B.V.